摘要
動態存取記憶體（ Dynamic Random
Access Memory, DRAM）也就是我們所說的
DRAM，DRAM 產業的景氣循環上下起伏變
化之大，有鑑於此，減少缺陷及降低成本皆
為各大半導體廠之目的，換言之，便是在於
減少生產上各層面的損失，來達到以最小資
源發揮最大效益之成效。因此本研究將探討
在DRAM 廠遇到各式各樣的缺陷使工廠各
項指標數據如OEE%(Overall Equipment
Effectiveness, 設備總和效率)降低時，如何
使用8D(8 Discipline)手法來解決問題，提升
相對數據，並減少損失與把資料彙整成為資
料庫，作為後續改善的範本。
關鍵字：動態存取記憶體、缺陷、8D 改善
手法。
ABSTRACT
DRAM firm always suffers from the
unbalance of supply and demand. It Causes the
product price is often lower than the cost. So,
DRAM firms always search the production
ways to keep increasing efficiency and
reducing the cost. One solution of reducing
cost is to decrease defects from production line,
improve the tool efficiency, to increase the
yield of the production and to promote the
machine using time. Therefore, how to keep
reducing defects becomes a very important
case of the DRAM production. This research is
to figure out the change of the defect in our
factory, when defect decreases, and influences
the product shipment. Then we using the 8D
improve method to solve this problem in the
PHOTO area at DRAM firm, we can find the
problem, analysis the problem and eliminate
the problem, not only decreased the defect but
also increased the efficiency, we can also reach
the data and record all data into book, and let it
be the samples in firm, and people can use
them if needed.
Keywords: DRAM; Defect; 8D discipline
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